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1Digital revistaSCIELO
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2Transmission Electron Microscopy (TEM) Through Focused ION Beam (FIB) from Vitrified Chromium Wastesby Ballesteros-Elizondo,S, Parga-Torres,J. R., Rincón-López,J. Ma., Palacios-González,E
Published 2011Digital revistaSCIELO -
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5by Mendoza-Madrigal,A.G., Chanona-Pérez,J.J., Hernández-Sánchez,H., Palacios-González,E., Calderón-Domínguez,G., Méndez-Méndez,J. V., Blasco,J., Villa-Vargas,L.A.
Published 2013Digital revistaSCIELO