-
1Transmission Electron Microscopy (TEM) Through Focused ION Beam (FIB) from Vitrified Chromium Wastesby Ballesteros-Elizondo,S, Parga-Torres,J. R., Rincón-López,J. Ma., Palacios-González,E
Published 2011Digital revistaSCIELO
To proceed, we need your consent for the processing of your personal data. By clicking "Accept" you agree to our terms and conditions of the "Privacy Notice".