Multiphoton ionization of naphthalene clusters at 266 nm
In this work we analyze the photoionization of Naphthalene clusters: dimmer, trimmer and tetramers when radiation of 266 nm from Nd:YAG laser at intensities up to 10(9) W·cm-2 was used, in the range from 0.5 to 20.0 mJ per pulse. The clusters were formed by thermal desorption of a sample at 373 K and translational and vibrationally cooled in a jet by adiabatic expansion. At these experimental conditions the ionization processes were accomplished in the multiphoton regime by two photon absorption. A complete identification of fragment ions arising from the clusters was carried out, using a linear time of flight mass analyzer, ToF-MA. Evidence of proton and carbon atoms migration between molecular units in the clusters was observed, and the ions C10Hs-H+ and (C10Hs)2-H+ were detected. The analysis of ion yield of clusters as a function of the energy per pulse showed that the dimmer stability is higher than trimmer and tetramer structures. The efficiency of clusters formation, and ionization processes were analyzed as a function of different carrier gases, CG: He, Ne, Ar, Kr and Xe. With He and Ne as CG, the ion yield decreases comparatively when Ar, Kr, Xe or not CG were used.
| Main Authors: | , , |
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| Format: | Digital revista |
| Language: | English |
| Published: |
Sociedad Mexicana de Física
2011
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| Online Access: | http://www.scielo.org.mx/scielo.php?script=sci_arttext&pid=S0035-001X2011000100012 |
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