Lr72 confers resistance to leaf rust in durum wheat cultivar Atil C2000
Leaf rust, caused by Puccinia triticina (Pt), has become a globally important disease for durum wheat (Triticum turgidum subsp. durum) since the detection of race group BBG/BN, which renders ineffective a widely deployed seedling resistance gene present in several popular cultivars including Mexican cultivars Altar C84 and Atil C2000. The resistance gene continues to play a key role in protecting durum wheat against bread wheat–predominant races since virulence among this race group has not been found. We developed F3 and F5mapping populations from a cross between Atil C2000 and the susceptible line Atred #1. Resistance was characterized by greenhouse seedling tests using three Pt races. Segregation tests indicated the presence of a single gene, which was mapped to the distal end of 7BS by bulk segregant analysis. The closest marker, wmc606, was located 5.5 cM proximal to the gene. No known leaf rust resistance genes are reported in this region; this gene was therefore designated as Lr72. The presence of Lr72 was further investigated in greenhouse tests in a collection of durum wheat using 13 Pt races. It was concluded that at least one additional gene protects durum wheat from bread wheat–predominant Ptraces.
| Main Authors: | , , , , |
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| Format: | Article biblioteca |
| Language: | English |
| Published: |
American Phytopathological Society (APS)
2014
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| Subjects: | AGRICULTURAL SCIENCES AND BIOTECHNOLOGY, Durum Wheat, BBG/BN, Segregation Tests, HARD WHEAT, RUSTS, PUCCINIA RECONDITA, SCREENING, GENETIC RESISTANCE, |
| Online Access: | https://hdl.handle.net/10883/19767 |
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