35th International Durum Yield Nursery

International Durum Yield Nurseries are replicated yield trials designed to measure the yield potential and adaptation of superior CIMMYT-bred spring durum wheat germplasm that have been developed from tests conducted under irrigation and induced stressed cropping conditions in northwest Mexico. These materials have been subjected to numerous diseases (leaf, stem and yellow rust; Septoria tritici blotch) and varied growing environments. It is distributed to 70 locations, and contains 50 entries.

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Détails bibliographiques
Auteurs principaux: Global Wheat Program, IWIN Collaborators, Ammar, Karim, Payne, Thomas
Autres auteurs: Rodriguez, Araceli
Format: Experimental data biblioteca
Langue:English
Publié: CIMMYT Research Data & Software Repository Network 2003
Sujets:Agricultural Sciences, Agricultural research, Wheat, Triticum durum, Agronomic score, Alternaria triticina, Days to heading, Days to maturity, Rodent damage per plot, Powdery mildew, Early vigor, Fusarium scab spike, Grain moisture, Grains spikelet, Grain yield, Helminthosporium sativum leaf, Stem rust, Plant height, Leaf rust, Stripe rust on leaf, Septoria species, Spike length, Septoria tritici blotch, Test weight, 1000 grain weight, Mega Environment 1, 35th IDYN, Selected check mark,
Accès en ligne:https://hdl.handle.net/11529/10548287
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