Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] /
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.
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Format: | Texto biblioteca |
Language: | eng |
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Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,
2002
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Subjects: | Materials science., Solid state physics., Crystallography., Spectroscopy., Microscopy., Materials, Thin films., Materials Science., Surfaces and Interfaces, Thin Films., Solid State Physics., Spectroscopy and Microscopy., Characterization and Evaluation of Materials., |
Online Access: | http://dx.doi.org/10.1007/978-3-662-04901-3 |
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KOHA-OAI-TEST:2259262018-07-31T00:06:46ZTransmission Electron Microscopy and Diffractometry of Materials [electronic resource] / Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service) textBerlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,2002.engThis textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.Contens -- 1 Diffraction and the X-Ray Powder Diffractometer -- 2 The TEM and its Optics -- 3 Scattering -- 4 Inelastic Electron Scattering and Spectroscopy -- 5 Diffraction from Crystals -- 6 Electron Diffraction and Crystallography -- 7 Diffraction Contrast in TEM Images -- 8 Diffraction Lineshapes -- 9 Patterson Functions and Diffuse Scattering -- 10 High-Resolution TEM Imaging -- 11 Dynamical Theory -- Further Reading -- References and Figures -- A Appendix -- A.1 Indexed Powder Diffraction Patterns -- A.3 Atomic Form Factors for X-Rays -- A.4 X-Ray Dispersion Corrections for Anomalous Scattering -- A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages -- A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp -- A.7 Stereographic Projections -- A.8 Examples of Fourier Transforms -- A.10 Numerical Approximation for the Voigt Function -- A.11 Debye—Waller Factor from Wave Amplitude -- A.12 Review of Dislocations -- A.13 TEM Laboratory Exercises -- A.13.1 Preliminary — JEOL 2000FX Daily Operation. -- A.13.2 Preliminary — Philips 400T Daily Operation -- A.13.6 Laboratory 4 — Contrast Analysis of Defects -- A.14 Fundamental and Derived Constants.This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.Materials science.Solid state physics.Crystallography.Spectroscopy.Microscopy.MaterialsThin films.Materials Science.Surfaces and Interfaces, Thin Films.Solid State Physics.Spectroscopy and Microscopy.Crystallography.Characterization and Evaluation of Materials.Springer eBookshttp://dx.doi.org/10.1007/978-3-662-04901-3URN:ISBN:9783662049013 |
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Materials science. Solid state physics. Crystallography. Spectroscopy. Microscopy. Materials Thin films. Materials Science. Surfaces and Interfaces, Thin Films. Solid State Physics. Spectroscopy and Microscopy. Crystallography. Characterization and Evaluation of Materials. Materials science. Solid state physics. Crystallography. Spectroscopy. Microscopy. Materials Thin films. Materials Science. Surfaces and Interfaces, Thin Films. Solid State Physics. Spectroscopy and Microscopy. Crystallography. Characterization and Evaluation of Materials. |
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Materials science. Solid state physics. Crystallography. Spectroscopy. Microscopy. Materials Thin films. Materials Science. Surfaces and Interfaces, Thin Films. Solid State Physics. Spectroscopy and Microscopy. Crystallography. Characterization and Evaluation of Materials. Materials science. Solid state physics. Crystallography. Spectroscopy. Microscopy. Materials Thin films. Materials Science. Surfaces and Interfaces, Thin Films. Solid State Physics. Spectroscopy and Microscopy. Crystallography. Characterization and Evaluation of Materials. Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service) Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / |
description |
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD. |
format |
Texto |
topic_facet |
Materials science. Solid state physics. Crystallography. Spectroscopy. Microscopy. Materials Thin films. Materials Science. Surfaces and Interfaces, Thin Films. Solid State Physics. Spectroscopy and Microscopy. Crystallography. Characterization and Evaluation of Materials. |
author |
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service) |
author_facet |
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service) |
author_sort |
Fultz, Brent. author. |
title |
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / |
title_short |
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / |
title_full |
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / |
title_fullStr |
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / |
title_full_unstemmed |
Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / |
title_sort |
transmission electron microscopy and diffractometry of materials [electronic resource] / |
publisher |
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, |
publishDate |
2002 |
url |
http://dx.doi.org/10.1007/978-3-662-04901-3 |
work_keys_str_mv |
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_version_ |
1756270914304999424 |