Nanoscale Spectroscopy and Its Applications to Semiconductor Research [electronic resource] /

Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher,taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.

Bibliographic Details

Main Authors:	Watanabe, Yoshio. editor., Salviati, Giancarlo. editor., Heun, Stefan. editor., Yamamoto, Naoki. editor., SpringerLink (Online service)
Format:	Texto biblioteca
Language:	eng
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg, 2002
Subjects:	Materials science., Solid state physics., Physical measurements., Measurement., Spectroscopy., Microscopy., Optical materials., Electronic materials., Nanotechnology., Materials Science., Optical and Electronic Materials., Solid State Physics., Spectroscopy and Microscopy., Measurement Science and Instrumentation.,
Online Access:	http://dx.doi.org/10.1007/3-540-45850-6
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