APA (7th ed.) Citation

Nicolici, N. a., Al-Hashimi, B. M. a., & service), S. (. (2003). Power-constrained Testing of VLSI Circuits [electronic resource]. Boston, MA : Springer US.

Chicago Style (17th ed.) Citation

Nicolici, Nicola. author., Bashir M. author Al-Hashimi, and SpringerLink (Online service). Power-constrained Testing of VLSI Circuits [electronic Resource]. Boston, MA : Springer US, 2003.

MLA (8th ed.) Citation

Nicolici, Nicola. author., et al. Power-constrained Testing of VLSI Circuits [electronic Resource]. Boston, MA : Springer US, 2003.

IICA/CATIE Citation

Nicolici, N. a., Al-Hashimi, B. M. a., ; service), S. (. 2003. Power-constrained Testing of VLSI Circuits [electronic resource]. Boston, MA : Springer US.