Bauer, G. e., Richter, W. e., & service), S. (. (1996). Optical Characterization of Epitaxial Semiconductor Layers [electronic resource]. Berlin, Heidelberg : Springer Berlin Heidelberg.
Citação do estilo Chicago (17ª ed.)Bauer, Günther. editor., Wolfgang. editor Richter, e SpringerLink (Online service). Optical Characterization of Epitaxial Semiconductor Layers [electronic Resource]. Berlin, Heidelberg : Springer Berlin Heidelberg, 1996.
Citação MLA (8ª ed.)Bauer, Günther. editor., et al. Optical Characterization of Epitaxial Semiconductor Layers [electronic Resource]. Berlin, Heidelberg : Springer Berlin Heidelberg, 1996.
Citação IICA/CATIEBauer, G. e., Richter, W. e., ; service), S. (. 1996. Optical Characterization of Epitaxial Semiconductor Layers [electronic resource]. Berlin, Heidelberg : Springer Berlin Heidelberg.